Metallic Materials — Equipment — Transmission Electron Microscope

TEM

transmission electron microscope

JEOL NEOARM 200F transmission electron microscope
funded by DFG (Inst 275/391-1)

Additional equipment:

Analyse:

EDX Double SDD (JEOL Centurio)
- count rates up to 100 000 cts/s
- energy resolution (122eV at Mn Kα)
EEL Spectrometer (Gatan Continuum) with energy resolution < 0.3eV
STEM (< 1 Å in STEM HAADF) mit folgenden Detektoren
- Bright field (BF)
- Annular Bright Field (ABF)
- Annular Dark Field (ADF)
- Secondary and Backscattered Electron (SE/BSE) detectors
4D STEM- Diffraction Mapping with STEM X (up to 300 frames/s)
Diffraction (CBD and NBD)

TEM-sample preparation:

Access to the FEI Helios NanoLab 600i focused ion beam system (FIB) of Prof. Carsten Ronning's group (IFK)
Ion beam polishing: Leica RES 101
Electrolyte beam polishing: Struers TenuPol-5

User rules for the transmission electron microscope